The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Default user image.

Uta Hejral

Researcher

Default user image.

Non-uniform nanosecond gate-delay of hybrid pixel detectors

Author

  • Roman Shayduk
  • David Pennicard
  • Konstantin Krausert
  • Peter Gaal
  • Sergey Volkov
  • Vedran Vonk
  • Uta Hejral
  • Maciej Jankowski
  • Matthias Reinhardt
  • Wolfram Leitenberger
  • Andreas Stierle

Summary, in English

A simple experiment to characterize the gating properties of X-ray area detectors using pulsed X-ray sources is presented. For a number of time-resolved experiments the gating uniformity of area detectors is important. Relative gating delays between individual modules and readout chips of PILATUS2 series area X-ray detectors have been observed. For three modules of a PILATUS300K-W unit the maximum gating offset between the modules is found to be as large as 30ns. On average, the first photosensor module is found to be triggered 15ns and 30ns later than the second and the third modules, respectively.The gating uniformity of Pilatus area X-ray detectors was characterized using synchrotron radiation. Gating offsets of more than 15ns were observed between different modules of a Pilatus300K-W detector.

Publishing year

2017-09-01

Language

English

Pages

1082-1085

Publication/Series

Journal of Synchrotron Radiation

Volume

24

Issue

5

Document type

Journal article

Publisher

International Union of Crystallography

Keywords

  • hybrid pixel X-ray detector
  • jitter
  • pump-probe X-ray diffraction
  • timing
  • triggering

Status

Published

ISBN/ISSN/Other

  • ISSN: 0909-0495