Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

Summary, in English

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.

• Author: Patrik Vagovič; Tokushi Sato; Ladislav Mikeš; Grant Mills; Rita Graceffa; Frans Mattsson; Pablo Villanueva-Perez; Alexey Ershov; Tomáš Faragó; Jozef Uličný; Henry Kirkwood; Romain Letrun; Rajmund Mokso; Marie Christine Zdora; Margie P. Olbinado; Alexander Rack; Tilo Baumbach; Joachim Schulz; Alke Meents; Henry N. Chapman; Adrian P. Mancuso
• Department/s: NanoLund: Centre for Nanoscience; Synchrotron Radiation Research; Solid Mechanics; MAX IV Laboratory
• Publishing year: 2019-01-01
• Language: English
• Pages: 1106-1109
• Publication/Series: Optica
• Volume: 6
• Issue: 9
• Links: http://dx.doi.org/10.1364/OPTICA.6.001106
• Document type: Journal article
• Publisher: Optica Publishing Group (formerly OSA)
• Topic: Condensed Matter Physics (including Material Physics, Nano Physics)
• Status: Published
• ISBN/ISSN/Other: ISSN: 2334-2536