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Pablo Villanueva Perez

Senior lecturer

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On the use of multilayer Laue lenses with X-ray free electron lasers

Author

  • Mauro Prasciolu
  • Kevin T. Murray
  • Nikolay Ivanov
  • Holger Fleckenstein
  • Martin Domaracký
  • Luca Gelisio
  • Fabian Trost
  • Kartik Ayyer
  • Dietrich Krebs
  • Steve Aplin
  • Salah Awel
  • Ulrike Boesenberg
  • Grega Belšak
  • Anton Barty
  • Armando D. Estillore
  • Matthias Fuchs
  • Yaroslav Gevorkov
  • Joerg Hallmann
  • Chan Kim
  • Juraj Knoška
  • Jochen Küpper
  • Chufeng Li
  • Wei Lu
  • Valerio Mariani
  • Andrew J. Morgan
  • Johannes Möller
  • Anders Madsen
  • Dominik Oberthür
  • Gisel E.Peña Murillo
  • David A. Reis
  • Markus Scholz
  • Bozidar Šarler
  • Pablo Villanueva-Perez
  • Oleksandr Yefanov
  • Kara A. Zielinski
  • Alexey Zozulya
  • Henry N. Chapman
  • Saša Bajt
Show all

Editor

  • Davide Bleiner

Summary, in English

We report on the use of multilayer Laue lenses to focus the intense X-ray Free Electron Laser (XFEL) beam at the European XFEL to a spot size of a few tens of nanometers. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique X-ray source.

Department/s

  • NanoLund: Centre for Nanoscience
  • Synchrotron Radiation Research

Publishing year

2021

Language

English

Publication/Series

Proceedings of SPIE - The International Society for Optical Engineering

Volume

11886

Document type

Conference paper

Publisher

SPIE

Topic

  • Atom and Molecular Physics and Optics

Keywords

  • Multilayer Laue lenses
  • Optics
  • X-rays
  • XFEL

Conference name

International Conference on X-Ray Lasers 2020

Conference date

2020-12-08 - 2020-12-10

Conference place

Virtual, Online

Status

Published

ISBN/ISSN/Other

  • ISSN: 0277-786X
  • ISSN: 1996-756X
  • ISBN: 9781510646186