The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Maria Messing. Portrait.

Maria Messing

Professor

Maria Messing. Portrait.

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Author

  • V. Favre-Nicolin
  • F. Mastropietro
  • J. Eymery
  • D. Camacho
  • Y. M. Niquet
  • Mattias Borg
  • Maria Messing
  • Lars-Erik Wernersson
  • R. E. Algra
  • E. P. A. M. Bakkers
  • T. H. Metzger
  • R. Harder
  • I. K. Robinson
Show all

Summary, in English

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

Department/s

  • Solid State Physics
  • Department of Electrical and Information Technology
  • NanoLund: Centre for Nanoscience

Publishing year

2010

Language

English

Publication/Series

New Journal of Physics

Volume

12

Document type

Journal article

Publisher

IOP Publishing

Topic

  • Condensed Matter Physics (including Material Physics, Nano Physics)
  • Electrical Engineering, Electronic Engineering, Information Engineering

Status

Published

Research group

  • Nano

ISBN/ISSN/Other

  • ISSN: 1367-2630