The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Default user image.

Jan Knudsen

Senior lecturer

Default user image.

Comparing phase sensitive detection and Fourier analysis of modulation excitation spectroscopy data exemplified by Ambient Pressure X-ray Photoelectron Spectroscopy

Author

  • Ulrike Küst
  • Julia Prumbs
  • Calley Eads
  • Weijia Wang
  • Virginia Boix
  • Alexander Klyushin
  • Mattia Scardamaglia
  • Robert Temperton
  • Andrey Shavorskiy
  • Jan Knudsen

Summary, in English

Dynamic processes in catalysis are gaining increased attention and could very well be one of the next frontiers in surface science. One way to study such processes is to induce chemical changes on the surface for example by periodically adjusting the (electro)chemical potential in situ and identify the resulting spectral changes. Often this is referred to as Modulation Excitation Spectroscopy (MES). Using Ambient Pressure Photoelectron Spectroscopy data, we here discuss and compare the analysis of MES data using both Phase Sensitive Detection (PSD) and Fourier analysis. We discuss that PSD determines the component magnitude at a user-defined phase value while Fourier analysis provides the maximum oscillation amplitude and respective phase value of oscillating spectral features. We discuss advantages and disadvantages of the different analysis schemes and explore how the full time-evolution can be obtained.

Department/s

  • Synchrotron Radiation Research
  • LU Profile Area: Light and Materials
  • MAX IV Laboratory
  • NanoLund: Centre for Nanoscience
  • LTH Profile Area: Photon Science and Technology
  • LTH Profile Area: Nanoscience and Semiconductor Technology

Publishing year

2025-01

Language

English

Publication/Series

Surface Science

Volume

751

Document type

Journal article

Publisher

Elsevier

Topic

  • Atom and Molecular Physics and Optics

Keywords

  • Ambient Pressure XPS
  • Fourier transform
  • Phase sensitive detection
  • Time-resolved

Status

Published

ISBN/ISSN/Other

  • ISSN: 0039-6028