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Edvin Lundgren. Portrait.

Edvin Lundgren

Professor

Edvin Lundgren. Portrait.

Lateral variation of the native passive film on super duplex stainless steel resolved by synchrotron hard X-ray photoelectron emission microscopy

Author

  • M. Långberg
  • F. Zhang
  • E. Grånäs
  • C. Örnek
  • J. Cheng
  • M. Liu
  • C. Wiemann
  • A. Gloskovskii
  • T. F. Keller
  • C. Schlueter
  • S. Kulkarni
  • H. Noei
  • D. Lindell
  • U. Kivisäkk
  • E. Lundgren
  • A. Stierle
  • J. Pan
Show all

Summary, in English

A native passive film on 25Cr-7Ni super duplex stainless steel was analyzed using synchrotron hard X-ray photoemission electron microscopy, focusing on variations between individual grains of ferrite and austenite phases. The film consists of an oxide inner layer and an oxyhydroxide outer layer, in total 2.3 nm thick. The Cr content is higher in the outer than the inner layer, ca. 80 % on average. The Cr content is higher on ferrite than austenite, whereas the thickness is rather uniform. The grain orientation has a small but detectable influence, ferrite (111) grains have a lower Cr content than other ferrite grains.

Department/s

  • Synchrotron Radiation Research
  • NanoLund: Centre for Nanoscience

Publishing year

2020

Language

English

Publication/Series

Corrosion Science

Volume

174

Document type

Journal article

Publisher

Elsevier

Topic

  • Metallurgy and Metallic Materials

Keywords

  • duplex stainless steel
  • lateral variation
  • passive film
  • photoelectron emission spectroscopy
  • synchrotron technique

Status

Published

ISBN/ISSN/Other

  • ISSN: 0010-938X