Surface x-ray study of the structure and morphology of the oxidized Pd(001) surface

Summary, in English

The oxidation of Pd(100) and the formation of PdO was studied in situ using surface x-ray diffraction. A bulklike, epitaxial PdO film is formed at oxygen partial pressures beyond 1 mbar and sample temperatures exceeding 650 K. The main orientation is PdO(001)/Pd(001), based upon bulk reflections from the PdO film. By comparing with measurements from the Pd crystal truncation rods, we estimate an rms surface roughness of 6 Angstrom, in good agreement with previous high pressure scanning tunneling microscopy measurements. Finally, we observed the transformation from the (root5 x root5) surface oxide to PdO bulk oxide at 675 K and 50 mbar O-2 pressure.

• Author: A Stierle; N Kasper; H Dosch; Edvin Lundgren; Johan Gustafson; Anders Mikkelsen; Jesper N Andersen
• Department/s: Synchrotron Radiation Research
• Publishing year: 2005
• Language: English
• Publication/Series: Journal of Chemical Physics
• Volume: 122
• Issue: 4
• Links: http://dx.doi.org/10.1063/1.1834491
• Document type: Journal article
• Publisher: American Institute of Physics (AIP)
• Topic: Atom and Molecular Physics and Optics
• Status: Published
• ISBN/ISSN/Other: ISSN: 0021-9606