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Anders Mikkelsen. Portrait.

Anders Mikkelsen

Professor

Anders Mikkelsen. Portrait.

Spatially resolved structural and chemical properties of the white layer in machined Inconel 718 super alloy

Author

  • L. A. B. Marçal
  • H. Dierks
  • V. Bushlya
  • I. Lazar
  • D. Dzhigaev
  • R. Zhe
  • R. Rysov
  • A. Björling
  • M. Sprung
  • A. Mikkelsen
  • F. Lenrick
  • R. M'Saoubi
  • J. Wallentin
Show all

Summary, in English

Inconel 718 is one type of nickel-based alloy used for a large range of applications, including gas turbines and aeroengines components. Although mechanical and thermodynamic properties of this material have been deeply studied in the past years, a method able to investigate local properties of the thin white layer formed on the alloy surface after machining remains challenging. Here, a 90 nm X-ray beam is used to probe the local strain, crystal orientation, and chemical composition of grains in the white layer. Data reveals mosaicity induced by the tool during machining. The high spatial resolution, combined with crystal lattice sensitivity, shows that the average grain size is around 30 nm throughout the white layer, while the strain is anisotropic nearest to the surface. Results provide new insights on the basic properties of the white layer in super alloys, revealing important information about the impact of finish machining which might help to explain fatigue and cracking formation on these materials during their usage phase.

Department/s

  • MAX IV Laboratory
  • Synchrotron Radiation Research
  • LU Profile Area: Light and Materials
  • LTH Profile Area: Nanoscience and Semiconductor Technology
  • NanoLund: Centre for Nanoscience
  • Production and Materials Engineering
  • SPI: Sustainable Production Initiative
  • LTH Profile Area: Photon Science and Technology
  • eSSENCE: The e-Science Collaboration

Publishing year

2024-03

Language

English

Publication/Series

Materials and Design

Volume

239

Document type

Journal article

Publisher

Elsevier

Topic

  • Materials Chemistry

Keywords

  • Inconel 718
  • White layer
  • X-ray diffraction
  • X-ray fluorescence

Status

Published

ISBN/ISSN/Other

  • ISSN: 0264-1275