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Anders Mikkelsen. Portrait.

Anders Mikkelsen

Professor

Anders Mikkelsen. Portrait.

Nanowire growth and dopants studied by cross-sectional scanning tunnelling microscopy

Author

  • Anders Mikkelsen
  • Niklas Sköld
  • Lassana Ouattara
  • Edvin Lundgren

Summary, in English

Using a crystalline embedding scheme it has recently become possible to study free-standing III - V nanowires with cross-sectional scanning tunnelling microscopy (XSTM). In the present paper we discuss how this novel method can be used for direct atomically resolved imaging of the interior of nanowires. We will focus in particular on two areas where this method provides unique possibilities. First we discuss the growth of the nanowire at the substrate as studied by XSTM and determine the facets of the nanowire growth on the surface and at the onset of free-standing nanowire growth. Second, we demonstrate how individual defects can be studied inside the wires, indicating a unique way for investigating dopant structures and concentrations in nanowires. We identify a carbon defect/dopant in the nanowire positioned on arsenic sites and establish quantitative limits on the defect density in the nanowires.

Department/s

  • Synchrotron Radiation Research
  • Solid State Physics

Publishing year

2006

Language

English

Pages

362-368

Publication/Series

Nanotechnology

Volume

17

Issue

11

Document type

Journal article

Publisher

IOP Publishing

Topic

  • Nano-technology

Status

Published

ISBN/ISSN/Other

  • ISSN: 0957-4484