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Anders Mikkelsen. Portrait.

Anders Mikkelsen

Professor

Anders Mikkelsen. Portrait.

Current−Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope

Author

  • Rainer Timm
  • Olof Persson
  • David Engberg
  • Alexander Fian
  • James Webb
  • Jesper Wallentin
  • Andreas Jönsson
  • Magnus Borgström
  • Lars Samuelson
  • Anders Mikkelsen

Summary, in English

Utilizing semiconductor nanowires for (opto)- electronics requires exact knowledge of their current−voltage properties. We report accurate on-top imaging and I−V characterization of individual as-grown nanowires, using a subnanometer resolution scanning tunneling microscope with no need for additional microscopy tools, thus allowing versatile application. We form Ohmic contacts to InP and InAs nanowires without any sample processing, followed by quantitative measurements of diameter dependent I−V properties with a very small spread in measured values compared to standard techniques.

Department/s

  • Synchrotron Radiation Research
  • Department of Physics
  • NanoLund: Centre for Nanoscience

Publishing year

2013

Language

English

Pages

5182-5189

Publication/Series

Nano Letters

Volume

13

Issue

11

Document type

Journal article

Publisher

The American Chemical Society (ACS)

Topic

  • Nano-technology

Keywords

  • semiconductor nanowire
  • scanning tunneling microscopy
  • Ohmic contact
  • nanowire contacts
  • resistivity

Status

Published

Research group

  • Nanometer structure consortium (nmC)

ISBN/ISSN/Other

  • ISSN: 1530-6992