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Anders Mikkelsen. Portrait.

Anders Mikkelsen

Professor

Anders Mikkelsen. Portrait.

Nanofocused x-ray beams applied for mapping strain in core-shell nanowires

Author

  • Tomas Stankevic
  • Dmitry Dzhigaev
  • Zhaoxia Bi
  • Max Rose
  • Anatoly Shabalin
  • Juliane Reinhardt
  • Anders Mikkelsen
  • Lars Samuelson
  • Gerald Falkenberg
  • Ivan A. Vartanyants
  • Robert Feidenhans'l
Show all

Summary, in English

The core-shell nanowires have the promise to become the future building blocks of light emitting diodes, solar cells and quantum computers. The high surface to volume ratio allows efficient elastic strain relaxation, making it possible to combine a wider range of materials into the heterostructures as compared to the traditional, planar geometry. As a result, the strain fields appear in both the core and the shell of the nanowires, which can affect the device properties. The hard x-ray nanoprobe is a tool that enables a nondestructive mapping of the strain and tilt distributions where other techniques cannot be applied. By measuring the positions of the Bragg peaks for each point on the sample we can evaluate the values of local tilt and strain. In this paper we demonstrate the detailed strain mapping of the strained InGaN/GaN core-shell nanowire. We observe an asymmetric strain distribution in the GaN core caused by an uneven shell relaxation. Additionally, we analyzed the local micro-tilt distribution, which shows the edge effects at the top and bottom of the nanowire. The measurements were compared to the finite element modelling and show a good agreement.

Department/s

  • Solid State Physics
  • NanoLund: Centre for Nanoscience
  • Synchrotron Radiation Research

Publishing year

2015

Language

English

Pages

95920-95920

Publication/Series

Proceedings of SPIE

Volume

9592

Document type

Conference paper

Publisher

SPIE

Topic

  • Nano-technology

Keywords

  • Nanowires
  • strain mapping
  • nanofocused X-rays
  • InGaN

Conference name

Conference on X-Ray Nanoimaging - Instruments and Methods II

Conference date

2015-08-12 - 2015-08-13

Status

Published

ISBN/ISSN/Other

  • ISSN: 1996-756X
  • ISSN: 0277-786X