Synchrotron-based near ambient-pressure X-ray photoelectron spectroscopy and electrochemical studies of passivation behavior of N- and V-containing martensitic stainless steel

Summary, in English

Passivation behavior of a N- and V-containing martensite stainless steel was studied by synchrotron-based near ambient-pressure X-ray photoelectron spectroscopy, electrochemical analyses, and thermodynamic calculation. The passive film consists of Cr³⁺, Fe^{(2, 3)+}, and V^{(2, 3, 4)+} oxides as inner layer, and Cr³⁺ and Fe³⁺ hydroxides as outer layer. Austenitization at 1080 ^oC (rather than 1010 ^oC) and anodic polarization facilitate transformation of CrN to Cr₂O₃ leading to further enrichment of Cr³⁺ oxide in the passive film. Whereas higher Cl^- concentration promotes film dissolution leading to higher level of point defects and higher fraction of remaining V oxides in the passive film.

• Author: Xiaoqi Yue; Alfred Larsson; Huajie Tang; Andrea Grespi; Mattia Scardamaglia; Andrey Shavorskiy; Anantha Krishnan; Edvin Lundgren; Jinshan Pan
• Department/s: LU Profile Area: Light and Materials; LTH Profile Area: Nanoscience and Semiconductor Technology; Synchrotron Radiation Research; NanoLund: Centre for Nanoscience; MAX IV Laboratory; LTH Profile Area: Photon Science and Technology
• Publishing year: 2023-04-15
• Language: English
• Publication/Series: Corrosion Science
• Volume: 214
• Links: http://dx.doi.org/10.1016/j.corsci.2023.111018
• Document type: Journal article
• Publisher: Elsevier
• Topic: Materials Engineering
• Keywords: Martensitic stainless steel; Nitrogen; Passive film; Synchrotron-based NAPXPS; Vanadium
• Status: Published
• ISBN/ISSN/Other: ISSN: 0010-938X