The Scanning Probe Facility mainly builds on scanning tunneling microscopy and spectroscopy (STM) and atomic force microscopy (AFM). Experiments can be performed in ultrahigh vacuum conditions (UHV), in air, and in liquids (with AFM). Research focuses on the surface characterization of semiconductor nanostructures, catalytically active materials, and two-dimensional materials, but also includes other types of samples. Correlation of structural, mechanical, and electronic properties across interfaces and heterostructures of technologically relevant materials at the atomic scale is one of the driving goals.
Scanning Tunneling Microscopes:
- Omicron STM 1: UHV STM with Auger, LEED, mass spectrometry, and evaporation and deposition sources
- Omicron VT STM: UHV STM with q-Plus AFM functionality and four separate contacts for electrical measurements
- Omicron VT STM: variable-temperature UHV STM with LEED and four separate contacts for electrical measurements
- Sigma Infinity STM: low-temperature UHV STM with closed-cycle cryostat, q-Plus AFM functionality, and four separate contacts for electrical measurements
- Unisoku SEUL STM: small, light-weight, open-geometry STM for flexible environments, with q-Plus AFM functionality
- JEOL JSTM: flexible STM for operation in UHV or in air
Atomic Force Microsocpes:
- JPK NanoWizard II (belongs to the division of Solid State Physics): AFM for operation in air or liquid environment, with c-AFM and KPFM functionality
- Nanosurf Naio AFM: small, flexible AFM
Management and Contact
The infrastructure is jointly managed by the following professors and associate professors of the Division of Synchrotron Radiation Research: Anders Mikkelsen, Rainer Timm, Edvin Lundgren, Jan Knudsen, Johan Gustafson, and Joachim Schnadt.